Method detects defects in 2-D materials for future electronics, sensors

To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2-D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2-D materials.

from Nanotechnology News - Nanoscience, Nanotechnolgy, Nanotech News https://ift.tt/37KbSh6